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This article has been cited by the following article(s):

Charge Trapping in Dielectrics

C. Bonnelle
Microscopy and Microanalysis 10 (6) 691 (2004)
DOI: 10.1017/S1431927604040620
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Charging phenomena on insulating materials: Mechanisms and applications

C. Le Gressus, F. Valin, M. Gautier, J. P. Duraud, J. Cazaux and H. Okuzumi
Scanning 12 (4) 203 (1990)
DOI: 10.1002/sca.4950120406
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C. Bonnelle, P. Jonnard and F. Vergand
305 (1995)
DOI: 10.1109/CEIDP.1995.483724
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