Elaboration and EXAFS characterization of amorphous MPS3 (M = Mn, Fe, Ni) thin films C. Gledel, J.-P. Audière, R. Clément and R. Cortes J. Chim. Phys., 86 (1989) 1691-1698 Published online: 29 May 2017 DOI: 10.1051/jcp/1989861691