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Cited article:

Étude de l’orientation et de la structure de films de sexithiophène (6T) déposés sur les surfaces de SiO₂ et de SiH/Si

P Lang, R Hajlaoui, JP Dallas, F Garnier, A Yassar, G Horowitz

J. Chim. Phys., 92 (1995) 967-970

Published online: 2017-05-29

DOI: https://doi.org/10.1051/jcp/1995920967

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This article has been cited by the following article(s):

Structure organization of sexithiophene vapour deposited onto HOPG and SiH/Si(111)

M. Ardhaoui, P. Lang, J.C. Wittmann, B. Lotz and F. Garnier
Synthetic Metals 101 (1-3) 526 (1999)
https://doi.org/10.1016/S0379-6779(98)00528-1

Denis Fichou and Christiane Ziegler
183 (1998)
https://doi.org/10.1002/9783527611713.ch4

Spectroscopic Evidence for a Substrate Dependent Orientation of Sexithiophene Thin Films Deposited onto Oriented PTFE

P. Lang, G. Horowitz, P. Valat, et al.
The Journal of Physical Chemistry B 101 (41) 8204 (1997)
https://doi.org/10.1021/jp9701303