Elaboration and EXAFS characterization of amorphous MPS3 (M = Mn, Fe, Ni) thin filmsC. Gledel, J.-P. Audière, R. Clément and R. CortesJ. Chim. Phys., 86 (1989) 1691-1698DOI: https://doi.org/10.1051/jcp/1989861691
