Issue |
J. Chim. Phys.
Volume 86, 1989
|
|
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Page(s) | 897 - 904 | |
DOI | https://doi.org/10.1051/jcp/1989860897 | |
Published online | 29 May 2017 |
MS-Xα and extended huckel calculations on lif : Ni+
1
Departamento de Física Moderna, Facultad de Ciencias, Universidad de Cantabria,
39005 Santander, Spain
2
D.C.I.T.T.Y.M., Sección Ciencia de Materiales, Facultad de Ciencias, Universidad de Cantabria, 39005 Santander, Spain
Selfconsistent charge Extended Huckel calculations on clusters including up to 81 atoms as well as MS-Xα calculations on a 27 atoms cluster have been performed in order to investigate theoretically a good number of E.P.R. and optical parameters for LiF:Ni+ with elongated octahedron symmetry around Ni+. In agreement with experimental data the present results give fσ close to 1%, xy→x2-y2 excitations close to 6000 cm-1 while the charge transfer transitions lie in the vacuum ultraviolet region. The mainly 3d levels lie in the gap about 4 eV above the top of the valence band while the mainly 4p levels lie about 2 eV below the bottom of the conduction band. The levels mainly built from 2 p(F') of four ligands are also strongly localized in the distorted NiF65- complex but located not on the top of the valence band but about 3.5 eV below. When the "equatorial" Ni+-F- distance, Req, decreases a) the energy of charge-transfer and crystal-field excitations increases, b) fs increases much more rapidly than fσ, although √fs/Ss is practically constant, independent of Req. This fact supports the use of the isotropic superhyperfine constant for measuring the true Req value.
Résumé
De nombreaux paramètres RPE et optiques ont été calculés sur un agrégat représentatif de l'impureté Ni+ dans LiF. Deux méthodes ont été utilisées, MSXalpha appliquée à un agrégat de 27 atomes, et EHT avec itérations de charges appliquée à des agrégats de 7, 27, et 81 atomes. La symétrie retenue est D4h sur le site Ni+, et l'influence de la distance équatoriale sur le déplacement des bandes optiques et sur les paramètres RPE a été étudiée.
© Paris : Société de Chimie Physique, 1989